From Characterization to Insight: Raman and Electron Microscopy for Semiconductor Materials
Join Covalent and Oxford Instruments for a full-day, hands-on workshop exploring how Raman spectroscopy, EBSD and EDS can reveal critical structural and chemical insights, accelerate semiconductor root cause analysis and guide materials development.
Event Description
Join experts from Covalent and Oxford Instruments for a full-day, hands-on workshop exploring how EBSD, EDS and Raman spectroscopy can be combined to move from characterization data to a clearer understanding of material behavior and root causes.
Through expert presentations, live instrument demonstrations and guided laboratory sessions, you’ll see how these techniques reveal crystal orientation, elemental composition, strain, defects, crystallinity and optoelectronic behavior. The sessions will connect fundamental concepts with applications in semiconductor research, manufacturing, quality control and materials development.
Designed for both new and experienced users, this workshop will provide practical insights into selecting and applying complementary techniques to accelerate problem-solving and make more informed materials decisions.

Reserve Your Seat
Complete the form below to reserve your place. Space is limited, and registrations will be confirmed on a first-come, first-served basis.
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