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Precise X-Ray Analysis Services for Your Materials

Fast, accurate x-ray analysis from an independant laboratory specializing in advanced material characterization. From phase identification to elemental composition - expert results delivered quickly. 

Get Expert Analysis of Your Material

What is X-Ray Analysis?

A powerful set of techniques used to identify elemental composition, crystalline structure, and phase information in a wide range of materials — without extensive sample preparation.

X-ray analysis is the cornerstone of modern material characterization. By measuring how materials interact with x-rays, our independent laboratory delivers critical insights that support research, development, quality control, and failure analysis.

Covalent provides unbiased, application-driven results. Our experts help you interpret data in the context of your specific material challenge — from identifying unknown contaminants to validating thin film composition.



X-Ray Diffraction (XRD): Identifies crystalline phases, measures crystallinity, and determines structural properties. Ideal for ceramics, metals, and pharmaceuticals.

Grazing Incidence X-Ray Techniques: Optimized for thin films and surface-sentive measurements. Critical for semiconductor and coating characterization. 

X-Ray Fluorescence (XRF): Elemental composition analysis of solids, powders, and coatings with minimal sample preparation.   

 

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Sample Introduction

Tell Us Your Goals

Submit a request and speak with a materials expert to determine the right x-ray method.

Separation

Ship Your Sample

We provide clear sample preparation and shipping instructions for accurate results.

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Analysis & Measurement

State-of-the-art instruments capture precise crystallographic and elemental data.

Data Analysis

Get Actionable Results

Receive a detailed report with expert interpretation tailored to your material.

Strengths & Limitations

As an independent laboratory, we help you choose the right technique for your application — including when another method may be better suited. 

 

Strengths

Non-destructive or minimally destructive analysis
Highly accurate elemental and phase identification
Suitable for solids, powders, and thin films of all types
Scalable from early-stage research to production support
Rapid turnaround with minimal sample preparation

Limitations

Detection limits vary by element and specific technique
Amorphous materials may require complementary methods
Surface sensitivity depends on the analysis approach

6 X-Ray Analysis Techniques Available

 Each technique targets a different material question. Our experts help you select the right approach — or combine multiple methods for the most complete picture. 

  • X-Ray Diffraction (XRD): Identifies crystalline phases, measures crystallinity, residual stress, and lattice parameters. Ideal for bulk solids, powders, thin fimls, and epitaxial layers.

  • Energy Dispersive X-Ray Fluoresence: Fast, non-destructive elemental composition and thin-film tickness analysis. Supports whole-wafer mapping with sub-nanometer thickness precision via integrated XRR.

  • Wavelength Dispersive X-Ray Fluorescence (WDXRF):  Higher spectral resolution than EDXRF — resolves overlapping elemental peaks for precise trace-level quantification. Covers Be (Z=4) through U (Z=92). 

  • Total Reflection X-Ray Fluorescence (TXRF): Ultra-trace detection of surface metallic contamination down to ~1×10¹⁰ atoms/cm². Grazing-incidence geometry minimizes background signal. Ideal for semiconductor wafers. 

  •  X-Ray Absorption Spectroscopy (XAS): Reveals oxidation states, coordination numbers, and bond distances around specific elements. Supports XANES and EXAFS. Ideal for catalysis, batteries, and environmental samples. 

  •  X-Ray Photoelectron Spectroscopy (XPS): Surface-specific elemental composition and chemical bonding state information from the top 5–8 nm of a material. Complements XRD and XRF with chemical state data. 

 

Your Material Analysis Begins Here

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