Precise X-Ray Analysis Services for Your Materials
Fast, accurate x-ray analysis from an independant laboratory specializing in advanced material characterization. From phase identification to elemental composition - expert results delivered quickly.
What is X-Ray Analysis?
A powerful set of techniques used to identify elemental composition, crystalline structure, and phase information in a wide range of materials — without extensive sample preparation.
X-ray analysis is the cornerstone of modern material characterization. By measuring how materials interact with x-rays, our independent laboratory delivers critical insights that support research, development, quality control, and failure analysis.
Covalent provides unbiased, application-driven results. Our experts help you interpret data in the context of your specific material challenge — from identifying unknown contaminants to validating thin film composition.
X-Ray Diffraction (XRD): Identifies crystalline phases, measures crystallinity, and determines structural properties. Ideal for ceramics, metals, and pharmaceuticals.
Grazing Incidence X-Ray Techniques: Optimized for thin films and surface-sentive measurements. Critical for semiconductor and coating characterization.
X-Ray Fluorescence (XRF): Elemental composition analysis of solids, powders, and coatings with minimal sample preparation.

Tell Us Your Goals
Submit a request and speak with a materials expert to determine the right x-ray method.
Ship Your Sample
We provide clear sample preparation and shipping instructions for accurate results.
Analysis & Measurement
State-of-the-art instruments capture precise crystallographic and elemental data.
Get Actionable Results
Receive a detailed report with expert interpretation tailored to your material.
Strengths & Limitations
As an independent laboratory, we help you choose the right technique for your application — including when another method may be better suited.
Strengths
Limitations
6 X-Ray Analysis Techniques Available
Each technique targets a different material question. Our experts help you select the right approach — or combine multiple methods for the most complete picture.
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X-Ray Diffraction (XRD): Identifies crystalline phases, measures crystallinity, residual stress, and lattice parameters. Ideal for bulk solids, powders, thin fimls, and epitaxial layers.
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Energy Dispersive X-Ray Fluoresence: Fast, non-destructive elemental composition and thin-film tickness analysis. Supports whole-wafer mapping with sub-nanometer thickness precision via integrated XRR.
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Wavelength Dispersive X-Ray Fluorescence (WDXRF): Higher spectral resolution than EDXRF — resolves overlapping elemental peaks for precise trace-level quantification. Covers Be (Z=4) through U (Z=92).
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Total Reflection X-Ray Fluorescence (TXRF): Ultra-trace detection of surface metallic contamination down to ~1×10¹⁰ atoms/cm². Grazing-incidence geometry minimizes background signal. Ideal for semiconductor wafers.
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X-Ray Absorption Spectroscopy (XAS): Reveals oxidation states, coordination numbers, and bond distances around specific elements. Supports XANES and EXAFS. Ideal for catalysis, batteries, and environmental samples.
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X-Ray Photoelectron Spectroscopy (XPS): Surface-specific elemental composition and chemical bonding state information from the top 5–8 nm of a material. Complements XRD and XRF with chemical state data.
Your Material Analysis Begins Here
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